Kinetics and morphological instabilities of stressed solid-solid phase transformations.
نویسندگان
چکیده
An atomistic model of the growth kinetics of stressed solid-solid phase transformations is presented. Solid phase epitaxial growth of (001) Si was used for comparison of new and prior models with experiments. The results indicate that the migration of crystal island ledges in the growth interface may involve coordinated atomic motion. The model accounts for morphological instabilities during stressed solid-solid phase transformations.
منابع مشابه
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ورودعنوان ژورنال:
- Physical review letters
دوره 100 16 شماره
صفحات -
تاریخ انتشار 2008